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ACM Computing Surveys (CSUR), Volume 22 Issue 1, March 1990

An overview of deterministic functional RAM chip testing
A. J. van de Goor, C. A. Verruijt
Pages: 5-33
DOI: 10.1145/78949.78950
This paper presents an overview of deterministic functional RAM chip testing. Instead of the traditional ad-hoc approach toward developing memory test algorithms, a hierarchy of functional faults and tests is presented, which is shown to cover...

Resourceful systems for fault tolerance, reliability, and safety
Russell J. Abbott
Pages: 35-68
DOI: 10.1145/78949.78951
Above all, it is vital to recognize that completely guaranteed behavior is impossible and that there are inherent risks in relying on computer systems in critical environments. The unforeseen consequences are often the most disastrous [Neumann...